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Silicon
Silicon, doi:10.1007/s12633-019-00287-2
ANFIS
EDM
Prediction
White layer
Experimental Investigation of White Layer Thickness on EDM Processed Silicon Steel Using ANFIS Approach
T. Muthuramalingam
D. Saravanakumar
L. Ganesh Babu
Nguyen Huu Phan
Vu Ngoc Pi
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